- Surface Morphology, Microstructure and Mechanical Properties of Thin Ag Films
-
Artur Shugurov, Alexey Panin, Hui-Gon Chun, Konstantin Oskomov
-
J Korean Powder Metall Inst. 2003;10(3):190-194.
-
DOI: https://doi.org/10.4150/KPMI.2003.10.3.190
-
-
202
View
-
0
Download
-
1
Citations
-
Abstract
PDF
- Thin Ag films deposited onto SiO_2/Si substrates by DC magnetron sputtering and thereafter annealed ,it temperatures 100-500°C are investigated by scanning tunneling and atomic forte microscopy. It is shown that the film surface topography and microstructure are considerably changed as a result of annealing. To provide a quantitative estimation of the surface topography changes of Ag films the surface fractal dimension was calculated. Elasticity and hardness of the films are studied by a nanoindentation technique. The films are found to have value of elastic modulus close to that of bulk silver while their hardness and yield stress are essentially higher.
-
Citations
Citations to this article as recorded by 
- Effect of surface roughness on electrical conductivity and hardness of silver plated copper
Ameneh Javidjam, Mohammad Hossein Hekmatshoar, Leila Hedayatifar, Sajjad Nasiri Khalil Abad Materials Research Express.2018; 6(3): 036407. CrossRef
|