- Atom Probe Tomography: A Characterization Method for Three-dimensional Elemental Mapping at the Atomic Scale
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Pyuck-Pa Choi, Ivan Povstugar
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J Korean Powder Metall Inst. 2012;19(1):67-71.
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DOI: https://doi.org/10.4150/KPMI.2012.19.1.067
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 Abstract
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- The present paper gives an overview about the Atom Probe Tomography technique and its application to powder materials. The preparation of needle-shaped Atom Probe specimens from a single powder particle using focused-ion-beam milling is described. Selected experimental data on mechanically alloyed (and sintered) powder materials are presented, giving insight into the atomic-scale elemental redistribution occurring under powder metallurgical processing.
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Citations
Citations to this article as recorded by  - Scanning electron microscopy imaging of multilayer-doped GaN: Effects of surface band bending, surface roughness, and contamination layers on doping contrast
Siyuan Wang, Kai Zhang, Le Zhai, Li Huang
Journal of Vacuum Science & Technology A.2024;[Epub] CrossRef
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